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Journal of Scientific Instruments vol 29 Fig 5
The Structure of Solid F1lms
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absorbing film absorption accuracy all-dielectric aluminium amplitude angle of incidence anti-reflecting atoms attainable bandwidth beam bulk material cadmium calculated cent change on reflection components condensation considerable cryolite crystal crystallites curves density dependence determined dielectric effect electric vector electron diffraction enables equations evaporated films experimental expressions extinction coefficient film thickness films deposited films of thickness Fresnel coefficients Fresnel reflection fringes germanium given glass gold films homogeneous indices intensity interference filter light reflected maxima measurements medium metal films method microscope multilayer non-normal incidence normal incidence observed obtained occurs optical behaviour optical constants optical properties optical thickness phase change phase difference Phys plane of incidence plates polarization range readily reflectance and transmittance reflection coefficient refractive index Section shown in Figure silver films spacer layer sputtering substrate suitable surface temperature thermal evaporation thin films tion transmission transparent film values variation visible spectrum wave wavelength