Practical Surface Analysis, Auger and X-ray Photoelectron SpectroscopyThe growth and diversification of surface analytical techniques began in the 1960s with the development of electron spectroscopy - first Auger electron spectroscopy (AES), closely followed by X-ray photo-electron spectroscopy (XPS or ESCA). Today these two complementary techniques still dominate the surface analysis scene. |
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Contents
Instrumentation | 19 |
Spectral Interpretation | 85 |
References | 139 |
Copyright | |
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Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy D. Briggs,M. P. Seah No preview available - 1996 |
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addition alloy aluminium analysis angle Appl applied atoms Auger background band binding energy bond calculations carbon catalyst changes Chapter charging Chem chemical composition contamination core corrosion deconvolution dependence depth depth profiling described detected determined differential discussed effects electron Electron Spectrosc elements equation example factor Figure function given gives grain boundary important increase intensity Interface Anal layer lead limited loss M. P. Seah materials measured metal method normal noted obtained occur oxide particularly peak photoelectron Phys platinum polymer position possible potential present pressure problem pump range ratio reactions reduced reference region relative removal resolution sample segregation shift shown in Figure shows silicon solid spectra spectrometer spectroscopy spectrum sputtering structure studies Surf surface Table techniques temperature thin valence values X-ray zeolite