Strained Silicon Heterostructures: Materials and Devices

Front Cover
C. K. Maiti, N. B. Chakrabarti, S. K. Ray, Institution of Electrical Engineers
IET, 2001 - Technology & Engineering - 496 pages

This book comprehensively covers the areas of materials growth, characterisation and descriptions for the new devices in siliconheterostructure material systems. In recent years, the development of powerful epitaxial growth techniques such as molecular beam epitaxy (MBE), ultra-high vacuum chemical vapour deposition (UHVCVD) and other low temperature epitaxy techniques has given rise to a new area of research of bandgap engineering in silicon-based materials. This has paved the way not only for heterojunction bipolar and field effect transistors, but also for other fascinating novel quantum devices. This book provides an excellent introduction and valuable references for postgraduate students and research scientists.

 

Contents

Strained Layer Epitaxy
24
Electronic Properties of Alloy Layers
98
Gate Dielectrics on Strained Layers
162
SiGe Heterojunction Bipolar Transistors
210
Heterostructure Field Effect Transistors
272
BICFET RTD and Other Devices
340
MODFETS
372
Contact Metallization on Strained Layers
409
SiSiGe Optoelectronics
440
Index
490
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Page 488 - Lett. 50, 760(1987). *TP Pearsall, J. Bevk, LC Feldman, JM Bonar, JP Mannaerts, and A. Ourmazd, Phys. Rev. Lett. 58, 729 (1987).