Electron Microscopy 1972: Proceedings of the Fifth European Congress on Electron Microscopy, University of Manchester, 5-12 September 1972, Volume 5 |
Contents
F H Plomp | 2 |
wurde Der Ausschuß ist jedoch überzeugt daß sich die Beschränkung des Themenkreises auf | 3 |
Cambridge | 10 |
Copyright | |
3 other sections not shown
Common terms and phrases
accelerating voltage analysis angle anode aperture astigmatism atoms axis Bloch wave Boersch calculated carbon cathode cell channelplate chromatic aberration coil contrast conventional crystal current density dark field defects detector determined diameter diffraction pattern dislocation distribution effect electron beam electron diffraction electron gun electron optical electron probe electrostatic electrostatic lens emitter energy loss excitation experimental field emission Figure film filter flux focal foil function glutaraldehyde Grenoble high resolution Hoppe illumination intensity Laboratory lattice lenses magnification material measured method objective lens observed obtained operation Optik p-n junction particles phase Phys plane plate pole piece polymers position possible potential Proc pump reconstruction sample scanning electron microscope screen secondary electrons sections Selected area diffraction shows specimen chamber spherical aberration stage stained structure surface technique temperature thickness thin tilt tion torr transmission electron transmission electron microscope vacuum values voltage X-ray