Quantitative X-Ray SpectrometryThis work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals |
Contents
1 Introduction | 1 |
2 The Interaction of Xrays with Matter | 6 |
3 Sources for the Excitation of Characteristic Xrays | 40 |
4 Instrumentation | 83 |
5 Statistics | 212 |
6 General Computer Appllcatlons and Quantitative Spectrum Analysis as Applied to EnergyDispersive Analysis | 241 |
7 Specimen Preparation | 271 |
8 Qualitative Analysis | 299 |
12 Radiation Health Hazards in Xray Spectrometry | 429 |
13 Applications of Xray Spectrometry | 439 |
Appendix 1 Nomenclature | 461 |
Appendix 2 Mass Absorption Coefficients | 463 |
Appendix 3 Conversions and Physical Constants | 467 |
Appendix 4 Atomic Weights and Densities | 469 |
Appendix 5 Atomic Wavelengths and Energies | 471 |
Appendix 6 Wavelength Tables for K L and M Series | 473 |
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Common terms and phrases
absorption coefficient absorption edge amplifier output amplifier pulse amplitude Anal analog-to-digital converter analysis analyte line angle anode atomic number background bremsstrahlung calculated channels characteristic lines chromium CMDL concentration correction courtesy of EG&G crystal deadtime losses detection limits detector diffraction distribution effects EG&G ORTEC electron emission Energy keV energy-dispersive spectrometers equation error escape peak factor Figure filter fluorescence spectrometer high counting rates incoherently scattered instrument K lines line intensity linear livetime mass absorption coefficient matrix method normal number of counts obtained output pulse parameters particle photon photon energy preamplifier probability density function problem proportional counter pulse height selector quantitative radiation range ratio Reprinted by courtesy sample sensitivity Si(Li specimen spectral standard deviation Table technique thickness trace elements tube current tube voltage variance voltage wavelength window x-ray fluorescence x-ray photon x-ray spectrometer x-ray tube Κα